A novel fast Fourier transform accelerated off-grid exhaustive search method for cryo-electron microscopy fitting
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: Journal of Applied Crystallography
سال: 2017
ISSN: 1600-5767
DOI: 10.1107/s1600576717008172